For coated sapphire components used in optical and precision applications, metallographic cross-sectioning is often used to evaluate coating and ink-layer thickness, interface quality, and overall integrity.

The challenge is preparation
Thin coatings can easily suffer from edge chipping, delamination, pull-off, or rounding during cutting and polishing, making the final cross-section difficult to measure accurately.

Methodology and steps
For this sample, we used precision low-speed sectioning and cold mounting to minimize mechanical and thermal damage, followed by a gradual grinding and polishing process:
- DiaRe P400 diamond grinding disc for initial grinding
- POS fine grinding disc + 9 um PD-WT polycrystalline diamond suspension
- SC white silk polishing cloth + 3 um PD-WT polycrystalline diamond suspension
- SC white silk polishing cloth + 1 um PD-WT polycrystalline diamond suspension for fine polishing

Results and conclusion
For coated samples like this, a good surface is not enough — preserving the true coating edge is what makes thickness measurement reliable.
#Metallography #Sapphire #CoatingAnalysis #CrossSection #SamplePreparation #OpticalMaterials


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